دانلود مقاله ISI انگلیسی شماره 55949
ترجمه فارسی عنوان مقاله

تجزیه و تحلیل سری های زمانی عملکرد سیستم های فتوولتائیک: فصلی بودن و تلفات عملکرد

عنوان انگلیسی
Analysis of photovoltaic system performance time series: Seasonality and performance loss
کد مقاله سال انتشار تعداد صفحات مقاله انگلیسی
55949 2015 13 صفحه PDF
منبع

Publisher : Elsevier - Science Direct (الزویر - ساینس دایرکت)

Journal : Renewable Energy, Volume 77, May 2015, Pages 51–63

ترجمه کلمات کلیدی
سیلیکون کریستالی؛ فیلم نازک؛ تنزل؛ تلفات عملکرد؛ تجزیه فصلی
کلمات کلیدی انگلیسی
Crystalline silicon; Thin-film; Degradation; Performance loss; Seasonal decomposition
پیش نمایش مقاله
پیش نمایش مقاله  تجزیه و تحلیل سری های زمانی عملکرد سیستم های فتوولتائیک: فصلی بودن و تلفات عملکرد

چکیده انگلیسی

In this work, the seasonality and performance loss rates of eleven grid-connected photovoltaic (PV) systems of different technologies were evaluated through seasonal adjustment. The classical seasonal decomposition (CSD) and X-12-ARIMA statistical techniques were applied on monthly DC performance ratio, RP, time series, constructed from field measurements over the systems' first five years of operation. The results have shown that the RP of crystalline silicon (c-Si) technologies was higher during winter. This was also the case for the copper–indium gallium-diselenide (CIGS) and cadmium telluride (CdTe) technologies but with lower seasonal amplitude. The amorphous silicon (a-Si) technology exhibited a different seasonal profile, with high RP during summer and autumn and low during winter. In addition, the trends extracted from the application of CSD and X-12-ARIMA on three-year, four-year and five-year RP time series were used to estimate linear performance loss rates. A comparison between standard linear regression (LR), CSD and X-12-ARIMA has shown that CSD and X-12-ARIMA resulted in higher rates overall for c-Si, 1.07 and 0.93%/year respectively, but with significantly less uncertainty than LR. Lastly, it was shown that X-12-ARIMA provided statistical inference in the presence of outliers and produced model residuals that were uncorrelated, in contrast to CSD.